Their optical dispersion behavior, defined by refractive index across various wavelengths and temperatures, is key to predicting light interaction. Reliable optical data enables improved material selection, optimized product design, and consistent performance in complex optical assemblies.
Using the SCHMIDT + HAENSCH ATR L Multi-Wavelength Refractometer, optical properties of films are measured directly and efficiently. This method enables the accurate mapping of refractive indices across multiple wavelengths (365 – 960 nm), providing valuable insight into the material’s dispersion characteristics. Whether for R&D or routine QC, the ATR L simplifies the complex task of analyzing adhesive layers, optical resins, or cured films like UV-cured acrylates, silicones, epoxies, or polyurethane adhesives. Beyond traditional quality control, evaluating dispersion curves allows for a deeper understanding of the material’s function in optical systems, especially where light transmission, reflection, and adhesion are key factors.